Author: Joseph L. Velayudhan A. Muraleedharan C.V.
Publisher: Edp Sciences
E-ISSN: 2107-6847|2|1|5-11
ISSN: 2107-6839
Source: International Journal of Metrology and Quality Engineering, Vol.2, Iss.1, 2011-06, pp. : 5-11
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract