Method development for the cyclic characterization of thin copper layers for PCB applications

Author: Fellner K.   Fuchs P.F.   Pinter G.   Antretter T.   Krivec T.  

Publisher: Emerald Group Publishing Ltd

ISSN: 0305-6120

Source: Circuit World, Vol.40, Iss.2, 2014-04, pp. : 53-60

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