Effect of topological placement of memory cells in memory chips on multiplicity of cell upsets from heavy charged particles

Author： Boruzdina A. Grigor’ev N. Ulanova A.

Publisher： MAIK Nauka/Interperiodica

ISSN： 1063-7397

Source： Russian Microelectronics, Vol.43, Iss.2, 2014-03, pp. : 96-101

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