An XPS depth-profile study on electrochemically deposited TaO x

Author: Moo James   Awaludin Zaenal   Okajima Takeyoshi   Ohsaka Takeo  

Publisher: Springer Publishing Company

ISSN: 1432-8488

Source: Journal of Solid State Electrochemistry, Vol.17, Iss.12, 2013-12, pp. : 3115-3123

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