Publisher: IOP Publishing
E-ISSN: 1361-6528|27|2|24003-24011
ISSN: 0957-4484
Source: Nanotechnology, Vol.27, Iss.2, 2016-01, pp. : 24003-24011
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
AN INTERFACE KINETICS STUDY OF OXIDATION PROCESS OF SILICON
By FANG F. HA M. QIU X. LIU J.
Integrated Ferroelectrics, Vol. 74, Iss. 1, 2005-09 ,pp. :
By Kim Seongbeom Jeong Jaeki Kim Gi-Hwan Rohani Parham Swihart Mark T Kim Seongbeom Kim Seongbeom Kim Seongbeom
Nanotechnology, Vol. 26, Iss. 30, 2015-07 ,pp. :