Author： Nyman R.A. Varoquaux G. Lienhart F. Chambon D. Boussen S. Clément J.-F. Müller T. Santarelli G. Pereira Dos Santos F. Clairon A. Bresson A. Landragin A. Bouyer P.
Publisher： Springer Publishing Company
ISSN： 0946-2171
Source： Applied Physics B, Vol.84, Iss.4, 2006-09, pp. : 673-681
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
I.C.E. Net and Lost Power Estimation During Free Run-Up and Coast-Down
By Braccesi C.
Meccanica, Vol. 32, Iss. 5, 1997-10 ,pp. :
Access to resources
Recommend
Comparison of Test Methods for Proper Characterization of VT in SiC MOSFETs
Materials Science Forum, Vol. 2016, Iss. 858, 2016-06 ,pp. :
Optical Characteristics of C60 Single Crystals Grown in Microgravity Conditions
By Steinman E.A. Avdeev S.V. Efimov V.B. Ivanov A.I. Izotov A.N. Kalmykov A.V. Kveder V.V. Markov E.V. Nikitskii V.P. Nikolaev R.K. Ossipyan Y.A. Padalko G.I. Sidorov N.S. Bazhenov A.V. Dilanyan R.A. Khasanov S.S.
Journal of Low Temperature Physics, Vol. 119, Iss. 3-4, 2000-05 ,pp. :