Thermal stability and switching field distribution of CoNi/Pt patterned media

Author： Murillo R.   Siekman M.   Bolhuis T.   Abelmann L.   Lodder J.  

Publisher： Springer Publishing Company

ISSN： 0946-7076

Source： Microsystem Technologies, Vol.13, Iss.2, 2007-01, pp. : 177-180

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