Reliability assessment for particle-induced failures in multi-generation hard disk drives

Author: Tang Loon-Ching   Ng Quock   Cheong Wee-Tat   Goh Jing-Shi  

Publisher: Springer Publishing Company

ISSN: 0946-7076

Source: Microsystem Technologies, Vol.13, Iss.8-10, 2007-05, pp. : 891-894

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next