Author: Scherer Benjamin Wöllenstein Jürgen Weidemüller Matthias Salzmann Wenzel Ostermann Johannes Rinaldi Fernando Michalzik Rainer
Publisher: Springer Publishing Company
ISSN: 0946-7076
Source: Microsystem Technologies, Vol.14, Iss.4-5, 2008-04, pp. : 607-614
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