Author： Thomsen-Schmidt P. Hasche K. Ulm G. Herrmann K. Krumrey M. Ade G. Stümpel J. Busch I. Schädlich S. Schindler A. Frank W. Hirsch D. Procop M. Beck U.
Publisher： Springer Publishing Company
ISSN： 0947-8396
Source： Applied Physics A, Vol.78, Iss.5, 2004-03, pp. : 645-649
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
Access to resources
Recommend
By Engert J. Fellmuth B. Hoffmann A.
Journal of Low Temperature Physics, Vol. 134, Iss. 1-2, 2004-01 ,pp. :
Thickness dependent electrical resistivity of ultrathin (<40 nm) Cu films
By Liu H.-D. Zhao Y.-P. Ramanath G. Murarka S.P. Wang G.-C.
Thin Solid Films, Vol. 384, Iss. 1, 2001-03 ,pp. :
Positive bias effects on the growth of diamond at pressures below 100 mTorr
Thin Solid Films, Vol. 316, Iss. 1, 1998-03 ,pp. :