Crystallographic orientation dependence of the dielectric constant in polymorphic BaNb2O6 thin films deposited by laser ablation

Author： Kim D.W.   Hong K.S.   Kim C.H.   Char K.  

Publisher： Springer Publishing Company

ISSN： 0947-8396

Source： Applied Physics A, Vol.79, Iss.3, 2004-08, pp. : 677-680

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