Effects of annealing conditions on the electrical properties of Bi4-xNdxTi3O12 (x = 0.46) thin films processed at low temperature

Author: Kim J.K.   Kim S.S.   Kim W.-J.  

Publisher: Springer Publishing Company

ISSN: 0947-8396

Source: Applied Physics A, Vol.82, Iss.4, 2006-03, pp. : 737-740

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