Growth and characterization of electro-deposited Cu2O and Cu thin films by amperometric I –T method on ITO/glass substrate

Author： Shang W.   Shi X.   Zhang X.   Ma C.   Wang C.  

Publisher： Springer Publishing Company

ISSN： 0947-8396

Source： Applied Physics A, Vol.87, Iss.1, 2007-04, pp. : 129-135

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