Nonlinear optical characterization of LaEr(MoO4)3 thin films using the Z -scan technique

Author: Gurudas U.   Bubb D.M.  

Publisher: Springer Publishing Company

ISSN: 0947-8396

Source: Applied Physics A, Vol.88, Iss.2, 2007-08, pp. : 255-259

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Related content