Author： Cartechini L. Miliani C. Brunetti B.G. Sgamellotti A. Altavilla C. Ciliberto E. D’Acapito F.
Publisher： Springer Publishing Company
ISSN： 0947-8396
Source： Applied Physics A, Vol.92, Iss.1, 2008-07, pp. : 243-250
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
In situ X-ray investigations of thin film growth
By Baranov A.M. Mikhailov I.F.
Thin Solid Films, Vol. 324, Iss. 1, 1998-07 ,pp. :
Access to resources
Recommend
Void fraction measurement by X-ray absorption
By Abbas Kendoush A. Azat Sarkis Z.
Experimental Thermal and Fluid Science, Vol. 25, Iss. 8, 2002-02 ,pp. :
Failure of the Quasiparticle Picture of X-ray Absorption?
By Rehr J.J.
Foundations of Physics, Vol. 33, Iss. 12, 2003-12 ,pp. :
By Morard G. Mezouar M. Rey N. Poloni R. Merlen A. Floch S. Le Toulemonde P. Pascarelli S. San-Miguel A. Sanloup C. Fiquet G.
International Journal of High Pressure Research, Vol. 27, Iss. 2, 2007-06 ,pp. :