Simulation-Based Inspection Policies for a One-Shot System in Storage Over a Finite Time Span

Author： Yun Won-young   Han Young-jin   Kim Ha-won  

Publisher： Taylor & Francis Ltd

ISSN： 0361-0918

Source： Communications in Statistics: Simulation and Computation, Vol.43, Iss.8, 2014-09, pp. : 1979-2003

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