DESIGN AND PERFORMANCE OF TWO ORTHOGONAL EXTRACTION TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETERS FOR FOCUSED ION BEAM INSTRUMENTS

Author: Alberts Deborah   von Werra Leandro   Oestlund Fredrik   Rohner Urs   Hohl Markus   Michler Johann   Whitby James A.  

Publisher: Taylor & Francis Ltd

ISSN: 1073-9149

Source: Instrumentation Science & Technology, Vol.42, Iss.4, 2014-07, pp. : 432-445

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