Determination of trapping–detrapping events, recombination processes and gap-state parameters by modulated photocurrent measurements on amorphous silicon

Author: Pomoni M.   Kounavis P.  

Publisher: Taylor & Francis Ltd

ISSN: 1478-6443

Source: Philosophical Magazine, Vol.94, Iss.21, 2014-07, pp. : 2447-2471

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