Impact of charged basal stacking faults on the mobility of two-dimensional electron gas in nonpolar a-plane AlGaN/GaN heterostructures

Author: ZhangJinfeng   YanRan   LiuGuipeng   LiuHaonan   AnBei   NieYuhu   HaoYue  

Publisher: IOP Publishing

E-ISSN: 1361-6641|30|8|85007-85013

ISSN: 0268-1242

Source: Semiconductor Science and Technology, Vol.30, Iss.8, 2015-08, pp. : 85007-85013

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