Effects of defect pixel correction algorithms for x-ray detectors on image quality in planar projection and volumetric CT data sets

Author： KuttigJan   SteidingChristian   HupferMartin   KarolczakMarek   KolditzDaniel  

Publisher： IOP Publishing

E-ISSN： 1361-6501|26|9|95406-95419

ISSN： 0957-0233

Source： Measurement Science and Technology, Vol.26, Iss.9, 2015-09, pp. : 95406-95419

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