Influence of dry-etching damage on the electrical properties of an AlGaN/GaN Schottky barrier diode with recessed anode

Author: Jian Zhong   Yao Yao   Yue Zheng   Fan Yang   Yi-Qiang Ni   Zhi-Yuan He   Zhen Shen   Gui-Lin Zhou   De-Qiu Zhou   Zhi-Sheng Wu   Bai-Jun Zhang   Yang Liu  

Publisher: IOP Publishing

E-ISSN: 1741-4199|24|9|97303-97307

ISSN: 1674-1056

Source: Chinese Physics B, Vol.24, Iss.9, 2015-09, pp. : 97303-97307

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content