The Thermographic Measuring of the Surface Temperature of the Peripheral Wall after Removing a Technical Device for Elimination of Reflected Radiation

Publisher： Trans Tech Publications

E-ISSN： 1662-8985|2015|1122|205-209

ISSN： 1022-6680

Source： Advanced Materials Research, Vol.2015, Iss.1122, 2015-09, pp. : 205-209

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Verification of Applicability of Thermographical Measuring of the Surface Temperature and the Influence of Emissivity of Glossy Materials while Eliminating the Reflected Radiation Using a Metal Shield

By  

Advanced Materials Research, Vol. 2015, Iss. 1122, 2015-09 ,pp. : 237-240

Trans Tech Publications

Access to resources Recommend Favorite

Measuring technical efficiency

By Ruggiero J.  

European Journal of Operational Research, Vol. 121, Iss. 1, 2000-02 ,pp. : 138-150

Elsevier

Access to resources Recommend Favorite

Silicon carbide and diamond for high temperature device applications

By Willander Magnus   Friesel Milan   Wahab Qamar-ul   Straumal Boris  

Journal of Materials Science: Materials in Electronics, Vol. 17, Iss. 1, 2006-01 ,pp. : 1-25

Springer Publishing Company

Access to resources Recommend Favorite

Deformation of layered structural elements in a temperature-radiation field

By Yarovaya A.  

Strength of Materials, Vol. 36, Iss. 6, 2004-11 ,pp. : 630-635

Springer Publishing Company

Access to resources Recommend Favorite

Solar Temperature Difference of a Complementary Power Generation Device for Automotive Applications

By  

Advanced Materials Research, Vol. 2014, Iss. 1070, 2015-01 ,pp. : 30-34

Trans Tech Publications

Access to resources Recommend Favorite