Author: Fotue A. J. Kenfack S. C. Issofa N. Tiotsop M. Fotsin H. Mainimo E. Fai L. C.
Publisher: IOP Publishing
ISSN: 1674-4926
Source: Journal of Semiconductors, Vol.36, Iss.9, 2015-09, pp. : 92001-92008
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