Analysis of functional failure mode of commercial deep sub-micron SRAM induced by total dose irradiation

Author： Qi-Wen Zheng   Jiang-Wei Cui   Hang Zhou   De-Zhao Yu   Xue-Feng Yu   Wu Lu   Qi Guo   Di-Yuan Ren  

Publisher： IOP Publishing

E-ISSN： 1741-4199|24|10|106106-106111

ISSN： 1674-1056

Source： Chinese Physics B, Vol.24, Iss.10, 2015-10, pp. : 106106-106111

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Pattern imprinting in deep sub-micron static random access memories induced by total dose irradiation

By Qi-Wen Zheng   Xue-Feng Yu   Jiang-Wei Cui   Qi Guo   Di-Yuan Ren   Zhong-Chao Cong   Hang Zhou  

Chinese Physics B, Vol. 23, Iss. 10, 2014-10 ,pp. : 106102-106108

IOP Publishing

Access to resources Recommend Favorite

Enhanced Total Ionizing Dose Hardness of Deep Sub-Micron Partially Depleted Silicon-on-Insulator n-Type Metal-Oxide-Semiconductor Field Effect Transistors by Applying Larger Back-Gate Voltage Stress

By  

Chinese Physics Letters, Vol. 31, Iss. 12, 2014-12 ,pp. : 126101-126103

IOP Publishing

Access to resources Recommend Favorite

Deep sub-micron stud-via technology for superconductor VLSI circuits

By  

Journal of Physics: Conference Series , Vol. 507, Iss. 4, 2014-05 ,pp. : 169-173

IOP Publishing

Access to resources Recommend Favorite

Polydimethylsiloxane (PDMS) Sub-Micron Traps for Single-Cell Analysis of Bacteria

By Probst Christopher   Grünberger Alexander   Wiechert Wolfgang   Kohlheyer Dietrich  

Micromachines, Vol. 4, Iss. 4, 2013-10 ,pp. : 357-369

MDPI

Access to resources Recommend Favorite

Application of Sonication and Microwave Irradiation to Boost Continuous Fabrication of the Copper(II) Oxide Sub-Micron Particles

By Dzido Grzegorz   Drzazga Michał   Markowski Piotr   Jarzębski Andrzej B.  

Technologies, Vol. 3, Iss. 1, 2015-03 ,pp. : 37-46

MDPI

Access to resources Recommend Favorite