Maximum entropy method and charge flipping, a powerful combination to visualize the true nature of structural disorder from in situ X‐ray powder diffraction data

Publisher: John Wiley & Sons Inc

E-ISSN: 1600-5740|66|2|184-195

ISSN: 0108-7681

Source: Acta Crystallographica Section B, Vol.66, Iss.2, 2010-04, pp. : 184-195

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