Serial block face‐scanning electron microscopy: A tool for studying embryonic development at the cell–matrix interface

Publisher: John Wiley & Sons Inc

E-ISSN: 1542-9768|105|1|9-18

ISSN: 1542-975X

Source: Birth Defects Research. Part C: Embryo Today Reviews, Vol.105, Iss.1, 2015-03, pp. : 9-18

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