Publisher: IOP Publishing
E-ISSN: 1742-6596|635|2|80-80
ISSN: 1742-6596
Source: Journal of Physics: Conference Series , Vol.635, Iss.2, 2015-09, pp. : 80-80
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
In situ characterization of atomic layer deposition processes by a mass spectrometer
Le Journal de Physique IV, Vol. 09, Iss. PR8, 1999-09 ,pp. :
Precision studies of fundamental atomic structure with heaviest few-electron ions
Hyperfine Interactions, Vol. 199, Iss. 1-3, 2011-07 ,pp. :
Feasibility studies for the Forward Spectrometer
Journal of Physics: Conference Series , Vol. 599, Iss. 1, 2015-04 ,pp. :