Electron probe microanalysis of Ni-silicides at low voltage: difficulties and possibilities

E-ISSN： 1757-899X|109|1|50-59

ISSN： 1757-899X

Source： IOP Conference Series: Materials Science and Engineering, Vol.109, Iss.1, 2016-02, pp. : 50-59

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Related content

Uncertainties in electron probe microanalysis

IOP Conference Series: Materials Science and Engineering, Vol. 7, Iss. 1, 2010-02 ,pp. : 150-159

IOP Publishing

Access to resources Recommend Favorite

A Study of Banding in Skelp by Electron-Probe Microanalysis

By Kirlcaldy J. s. Brigham R. J. Damian H. A. Ward R. G.

Canadian Metallurgical Quarterly, Vol. 2, Iss. 3, 1963-07 ,pp. : 233-241

Maney Publishing

Access to resources Recommend Favorite

Electron probe microanalysis of the dopant concentrations in complex perovskite ferroelectrics

IOP Conference Series: Materials Science and Engineering, Vol. 109, Iss. 1, 2016-02 ,pp. : 171-181

IOP Publishing

Access to resources Recommend Favorite

Low voltage EPMA: experiments on a new frontier in microanalysis - analytical lateral resolution

IOP Conference Series: Materials Science and Engineering, Vol. 109, Iss. 1, 2016-02 ,pp. : 27-39

IOP Publishing

Access to resources Recommend Favorite

Low voltage imaging and X-ray microanalysis in the SEM: challenges and opportunities

IOP Conference Series: Materials Science and Engineering, Vol. 109, Iss. 1, 2016-02 ,pp. : 216-229

IOP Publishing

Access to resources Recommend Favorite