Publisher： IOP Publishing
E-ISSN： 1742-6596|671|1|1-5
ISSN： 1742-6596
Source： Journal of Physics: Conference Series , Vol.671, Iss.1, 2016-01, pp. : 1-5
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
Non-destructive testing of dielectric layers with defects
Journal of Physics: Conference Series , Vol. 135, Iss. 1, 2008-11 ,pp. :
Access to resources
Recommend
Investigations and Non-destructive Testing in New Building Design
Journal of Physics: Conference Series , Vol. 671, Iss. 1, 2016-01 ,pp. :
Non-Destructive Techniques Based on Eddy Current Testing
By García-Martín Javier Gómez-Gil Jaime Vázquez-Sánchez Ernesto
Sensors, Vol. 11, Iss. 3, 2011-02 ,pp. :
An Innovative Phase Shifting System for Non-Destructive Testing
Journal of Mechanics, Vol. 14, Iss. 1, 1998-03 ,pp. :
Access to resources