A New Method for Axial Decay Function Calibration of Evanescent Field in Multi-Angle Total Internal Reflection Fluorescence Microscopy

Publisher： IOP Publishing

E-ISSN： 1742-6596|680|1|136-140

ISSN： 1742-6596

Source： Journal of Physics: Conference Series , Vol.680, Iss.1, 2016-01, pp. : 136-140

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