Defects detection by infrared thermography with a new microwave excitation system

Author: Keo Sam Ang   Brachelet Franck   Defer Didier   Breaban Florin  

Publisher: Edp Sciences

E-ISSN: 2257-7750|15|6|509-516

ISSN: 2257-7777

Source: Mechanics & Industry, Vol.15, Iss.6, 2014-11, pp. : 509-516

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Abstract