

Author: Dang This Ngoc Yen Webb Stuart
Publisher: John Benjamins Publishing Company
E-ISSN: 1783-1490|167|2|132-158
ISSN: 0019-0829
Source: ITL - International Journal of Applied Linguistics, Vol.167, Iss.2, 2016-01, pp. : 132-158
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content


High-Frequency Electric Transport through Nano-Junctions
By Xu Yuehua Liu Rui Ke San-Huang
Integrated Ferroelectrics, Vol. 128, Iss. 1, 2011-01 ,pp. :





