Global stability analysis method to numerically predict precursor of breakdown voltage

Author: Shibata Hisaichi   Ohmichi Yuya   Watanabe Yasumasa   Suzuki Kojiro  

Publisher: IOP Publishing

E-ISSN: 1361-6595|24|5|55014-55025

ISSN: 0963-0252

Source: Plasma Sources Science and Technology, Vol.24, Iss.5, 2015-10, pp. : 55014-55025

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Abstract