Thickness mode EMIS of constrained proof-mass piezoelectric wafer active sensors

Author： Kamas Tuncay   Giurgiutiu Victor   Lin Bin  

Publisher： IOP Publishing

E-ISSN： 1361-665X|24|11|115035-115051

ISSN： 0964-1726

Source： Smart Materials and Structures, Vol.24, Iss.11, 2015-11, pp. : 115035-115051

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