X‐ray diffraction by close‐packed crystals with `growth‐' and `deformation or transformation stacking faults' assuming an `n‐layer influence'

Publisher： John Wiley & Sons Inc

E-ISSN： 0365-110x|7|11|740-744

ISSN： 0365-110x

Source： Acta Crystallographica, Vol.7, Iss.11, 1954-11, pp. : 740-744

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