The use of shorter wavelengths in X‐ray diffraction in relation to scintillation counting

Publisher: John Wiley & Sons Inc

E-ISSN: 0365-110x|8|11|659-661

ISSN: 0365-110x

Source: Acta Crystallographica, Vol.8, Iss.11, 1955-11, pp. : 659-661

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