The Effect of White-Noise Mask Level on Sinewave Contrast Detection Thresholds and the Critical-Band-Masking Model

Publisher： Cambridge University Press

E-ISSN： 1988-2904|9|2|249-262

ISSN： 1138-7416

Source： Spanish Journal of Psychology, Vol.9, Iss.2, 2006-11, pp. : 249-262

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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