Using Positive and Negative Sequence Components of Currents and Voltages for High Impedance Fault Analysis via ANFIS

Publisher: IGI Global_journal

E-ISSN: 2160-9799|1|4|132-157

ISSN: 2160-9772

Source: International Journal of System Dynamics Applications (IJSDA), Vol.1, Iss.4, 2012-10, pp. : 132-157

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