A proposed simulation technique to study the series resistance and related millimeter-wave properties of Ka-band Si IMPATTs from the electric field snapshots
Publisher: Cambridge University Press
E-ISSN: 1759-0795|5|1|91-100
ISSN: 1759-0787
Source: International Journal of Microwave and Wireless Technologies, Vol.5, Iss.1, 2013-01, pp. : 91-100
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Abstract