Study on mechanisms of InGaP/GaAs HBT safe operating area using TCAD simulation

Publisher： Cambridge University Press

E-ISSN： 1759-0795|7|3-4|279-285

ISSN： 1759-0787

Source： International Journal of Microwave and Wireless Technologies, Vol.7, Iss.3-4, 2015-06, pp. : 279-285

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