Publisher: Trans Tech Publications
E-ISSN: 1662-8985|2016|1140|107-114
ISSN: 1022-6680
Source: Advanced Materials Research, Vol.2016, Iss.1140, 2016-10, pp. : 107-114
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Experimental Verification of Effect of Adhesive Layer Thickness Used for Strain Gauge Mounting
Advanced Materials Research, Vol. 2015, Iss. 1119, 2015-08 ,pp. :
Wide Range and Accurate Measurement of Wafer Thickness Gauge Using Optical Spectral Analyzer
Advanced Materials Research, Vol. 2015, Iss. 806, 2015-12 ,pp. :