Measurement and numerical analysis of C-V characteristics for normally-on SiCED-JFET

Author： Ghedira Sami   Buttay Cyril   Morel Hervé   Besbes Kamel  

Publisher： Edp Sciences

E-ISSN： 1286-0050|66|2|20103-20103

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.66, Iss.2, 2014-06, pp. : 20103-20103

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