In situ break-junction sample holder for transmission electron microscopy

Author： Eswara Moorthy Santhana K.   Le Goff Gerald   Viret Michel   Kociak Mathieu  

Publisher： Edp Sciences

E-ISSN： 1286-0050|64|3|31001-31001

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.64, Iss.3, 2013-12, pp. : 31001-31001

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