Single atom spectroscopy with reduced delocalization effect using a 30 kV-STEM

Author： Suenaga K.   Iizumi Y.   Okazaki T.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|54|3|33508-33508

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.54, Iss.3, 2011-06, pp. : 33508-33508

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