Author: Jeanvoine N. Velichko A. Selzner C. Mücklich F.
Publisher: Edp Sciences
E-ISSN: 1286-0050|49|2|22907-22907
ISSN: 1286-0042
Source: EPJ Applied Physics (The), Vol.49, Iss.2, 2010-02, pp. : 22907-22907
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Abstract
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