Nanotomography of electrical contacts – new insights by high resolution 3D analysis of local material degradation

Author: Jeanvoine N.   Velichko A.   Selzner C.   Mücklich F.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|49|2|22907-22907

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.49, Iss.2, 2010-02, pp. : 22907-22907

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Abstract