Author: Ben Slimen N. Deniau V. Rioult J. Dudoyer S. Baranowski S.
Publisher: Edp Sciences
E-ISSN: 1286-0050|48|2|21202-21202
ISSN: 1286-0042
Source: EPJ Applied Physics (The), Vol.48, Iss.2, 2009-09, pp. : 21202-21202
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Abstract