Evaluation of organic sub-monolayers by X-ray based measurements under gracing incident conditions

Author: Werzer O.   Stadlober B.   Haase A.   Flesch H.-G.   Resel R.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|46|2|20403-20403

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.46, Iss.2, 2009-03, pp. : 20403-20403

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Abstract