Author: Sabo M. Klas M. Wang H. Huang C. Chu Y. Matejčík Š.
Publisher: Edp Sciences
E-ISSN: 1286-0050|55|1|13808-13808
ISSN: 1286-0042
Source: EPJ Applied Physics (The), Vol.55, Iss.1, 2011-07, pp. : 13808-13808
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Abstract