Determination of critical island size in para-sexiphenyl islands on SiO2 using capture-zone scaling

Author: Lorbek S.   Hlawacek G.   Teichert C.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|55|2|23902-23902

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.55, Iss.2, 2011-08, pp. : 23902-23902

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Abstract