Advanced backside sample preparation for multi-technique surface analysis

Author: Py M.   Veillerot M.   Fabbri J.M.   Pierre F.   Jalabert D.   Roukoss C.   Pelissier B.   Boujamaa R.   Trouiller C.   Barnes J.P.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|55|3|31001-31001

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.55, Iss.3, 2011-08, pp. : 31001-31001

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract